CUED Publications database

Plasmon-Induced Trap State Emission from Single Quantum Dots

Huang, J and Ojambati, OS and Chikkaraddy, R and Sokołowski, K and Wan, Q and Durkan, C and Scherman, OA and Baumberg, JJ (2021) Plasmon-Induced Trap State Emission from Single Quantum Dots. Physical Review Letters, 126. ISSN 0031-9007

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Charge carriers trapped at localized surface defects play a crucial role in quantum dot (QD) photophysics. Surface traps offer longer lifetimes than band-edge emission, expanding the potential of QDs as nanoscale light-emitting excitons and qubits. Here, we demonstrate that a nonradiative plasmon mode drives the transfer from two-photon-excited excitons to trap states. In plasmonic cavities, trap emission dominates while the band-edge recombination is completely suppressed. The induced pathways for excitonic recombination not only shed light on the fundamental interactions of excitonic spins, but also open new avenues in manipulating QD emission, for optoelectronics and nanophotonics applications.

Item Type: Article
Depositing User: Cron Job
Date Deposited: 23 Dec 2020 20:05
Last Modified: 13 Apr 2021 09:42
DOI: 10.1103/PhysRevLett.126.047402