Connolly, MR and Chiou, KL and Smith, CG and Anderson, D and Jones, GAC and Lombardo, A and Fasoli, A and Ferrari, AC (2010) Scanning gate microscopy of current-annealed single layer graphene. APPL PHYS LETT, 96. -. ISSN 0003-6951
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|Item Type: ||Article|
|Uncontrolled Keywords: ||annealing current density electrical conductivity electron-hole recombination graphene scanning probe microscopy CHARGE INHOMOGENEITY TRANSPORT TRANSISTOR|
|Depositing User: ||Cron Job|
|Date Deposited: ||01 Jan 2012 19:01|
|Last Modified: ||27 May 2013 01:24|
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