Connolly, MR and Chiou, KL and Smith, CG and Anderson, D and Jones, GAC and Lombardo, A and Fasoli, A and Ferrari, AC (2010) Scanning gate microscopy of current-annealed single layer graphene. APPL PHYS LETT, 96. -. ISSN 0003-6951
Full text not available from this repository.
| Item Type: | Article |
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| Uncontrolled Keywords: | annealing current density electrical conductivity electron-hole recombination graphene scanning probe microscopy CHARGE INHOMOGENEITY TRANSPORT TRANSISTOR |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 01 Jan 2012 19:01 |
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| Last Modified: | 27 May 2013 01:24 |
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| DOI: | 10.1063/1.3327829 |
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