Ghaffarzadeh, K and Nathan, A and Robertson, J and Kim, S and Jeon, S and Kim, C and Chung, UI and Lee, JH (2010) Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress. APPL PHYS LETT, 97. -. ISSN 0003-6951Full text not available from this repository.
|Uncontrolled Keywords:||OXIDE SEMICONDUCTORS TFTS|
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Cron Job|
|Date Deposited:||18 May 2016 17:55|
|Last Modified:||24 Jul 2016 03:36|