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Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress

Ghaffarzadeh, K and Nathan, A and Robertson, J and Kim, S and Jeon, S and Kim, C and Chung, UI and Lee, JH (2010) Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress. APPL PHYS LETT, 97. -. ISSN 0003-6951

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Item Type: Article
Uncontrolled Keywords: OXIDE SEMICONDUCTORS TFTS
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:20
Last Modified: 04 Sep 2015 22:56
DOI: 10.1063/1.3480547