Ghaffarzadeh, K and Nathan, A and Robertson, J and Kim, S and Jeon, S and Kim, C and Chung, UI and Lee, JH (2010) Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress. APPL PHYS LETT, 97. -. ISSN 0003-6951
Full text not available from this repository.
| Item Type: | Article |
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| Uncontrolled Keywords: | OXIDE SEMICONDUCTORS TFTS |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 19 Jan 2012 11:11 |
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| Last Modified: | 20 May 2013 01:31 |
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| DOI: | 10.1063/1.3480547 |
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