Ghaffarzadeh, K and Nathan, A and Robertson, J and Kim, S and Jeon, S and Kim, C and Chung, UI and Lee, JH (2010) Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress. APPL PHYS LETT, 97. -. ISSN 0003-6951
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|Item Type: ||Article|
|Uncontrolled Keywords: ||OXIDE SEMICONDUCTORS TFTS|
|Depositing User: ||Cron Job|
|Date Deposited: ||19 Jan 2012 11:11|
|Last Modified: ||16 Dec 2013 01:12|
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