CUED Publications database

Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress

Ghaffarzadeh, K and Nathan, A and Robertson, J and Kim, S and Jeon, S and Kim, C and Chung, UI and Lee, JH (2010) Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress. APPL PHYS LETT, 97. -. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: OXIDE SEMICONDUCTORS TFTS
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:28
Last Modified: 13 Oct 2014 01:12
DOI: 10.1063/1.3480547