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Electronic and microstructure characterization of strontium-bismuth tantalate (SBT) thin films

Hartmann, AJ and Lamb, RN and Scott, JF and Johnston, PN and El Bouanani, M and Chen, CW and Robertson, J (1998) Electronic and microstructure characterization of strontium-bismuth tantalate (SBT) thin films. In: UNSPECIFIED S1329-S1331..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:53
Last Modified: 17 Mar 2014 15:00
DOI:

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