CUED Publications database

Real time resistometric depth monitoring in the focused ion beam

Latif, A and Booij, WE and Durrell, JH and Blamire, MG (2000) Real time resistometric depth monitoring in the focused ion beam. J VAC SCI TECHNOL B, 18. pp. 761-764. ISSN 1071-1023

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div C > Materials Engineering
Depositing User: Cron Job
Date Deposited: 18 May 2016 17:55
Last Modified: 01 Jun 2016 00:30
DOI: