Latif, A and Booij, WE and Durrell, JH and Blamire, MG (2000) Real time resistometric depth monitoring in the focused ion beam. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 18. pp. 761-764. ISSN 1071-1023
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div C > Materials Engineering |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 16:38 |
| Last Modified: | 20 May 2013 01:33 |
| DOI: | 10.1116/1.591273 |
Actions (login required)
| View Item |
