CUED Publications database

Real time resistometric depth monitoring in the focused ion beam

Latif, A and Booij, WE and Durrell, JH and Blamire, MG (2000) Real time resistometric depth monitoring in the focused ion beam. J VAC SCI TECHNOL B, 18. pp. 761-764. ISSN 1071-1023

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div C > Materials Engineering
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 12:49
Last Modified: 04 May 2016 06:45
DOI: