Tee, CW and Lau, FK and Zhao, X and Penty, R and White, I (2006) Focussed-ion-beam post-processing technology for active devices. In: UNSPECIFIED U258-U269..
Full text not available from this repository.
|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Uncontrolled Keywords: ||focussed ion beam etching post-processing photonic integration surface profiling lens structure photonic crystals surface relieved VCSELs waveguide structures WAVE-GUIDES SPLITTER WAVELENGTH VCSELS|
|Divisions: ||Div B > Photonics|
|Depositing User: ||Cron Job|
|Date Deposited: ||20 Jan 2012 12:11|
|Last Modified: ||09 Sep 2013 01:16|
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