Tee, CW and Lau, FK and Zhao, X and Penty, R and White, I (2006) Focussed-ion-beam post-processing technology for active devices. In: UNSPECIFIED U258-U269..
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|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Uncontrolled Keywords: ||focussed ion beam etching post-processing photonic integration surface profiling lens structure photonic crystals surface relieved VCSELs waveguide structures WAVE-GUIDES SPLITTER WAVELENGTH VCSELS|
|Divisions: ||Div B > Photonics|
|Depositing User: ||Cron Job|
|Date Deposited: ||07 Mar 2014 11:58|
|Last Modified: ||10 Mar 2014 17:09|
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