Tee, CW and Lau, FK and Zhao, X and Penty, R and White, I (2006) Focussed-ion-beam post-processing technology for active devices. In: UNSPECIFIED U258-U269..
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Uncontrolled Keywords: | focussed ion beam etching post-processing photonic integration surface profiling lens structure photonic crystals surface relieved VCSELs waveguide structures WAVE-GUIDES SPLITTER WAVELENGTH VCSELS |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Photonics |
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| Depositing User: | Cron Job |
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| Date Deposited: | 20 Jan 2012 12:11 |
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| Last Modified: | 16 May 2013 19:22 |
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| DOI: | 10.1117/12.691640 |
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