Connolly, MR and Chiou, KL and Smith, CG and Anderson, D and Jones, GAC and Lombardo, A and Fasoli, A and Ferrari, AC (2010) Scanning gate microscopy of current-annealed single layer graphene. Applied Physics Letters, 96. ISSN 0003-6951Full text not available from this repository.
We have used scanning gate microscopy to explore the local conductivity of a current-annealed graphene flake. A map of the local neutrality point (NP) after annealing at low current density exhibits micron-sized inhomogeneities. Broadening of the local e-h transition is also correlated with the inhomogeneity of the NP. Annealing at higher current density reduces the NP inhomogeneity, but we still observe some asymmetry in the e-h conduction. We attribute this to a hole-doped domain close to one of the metal contacts combined with underlying striations in the local NP. © 2010 American Institute of Physics.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Cron Job|
|Date Deposited:||07 Mar 2014 12:11|
|Last Modified:||08 Dec 2014 02:36|