CUED Publications database

Scanning gate microscopy of current-annealed single layer graphene

Connolly, MR and Chiou, KL and Smith, CG and Anderson, D and Jones, GAC and Lombardo, A and Fasoli, A and Ferrari, AC (2010) Scanning gate microscopy of current-annealed single layer graphene. Applied Physics Letters, 96. ISSN 0003-6951

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Abstract

We have used scanning gate microscopy to explore the local conductivity of a current-annealed graphene flake. A map of the local neutrality point (NP) after annealing at low current density exhibits micron-sized inhomogeneities. Broadening of the local e-h transition is also correlated with the inhomogeneity of the NP. Annealing at higher current density reduces the NP inhomogeneity, but we still observe some asymmetry in the e-h conduction. We attribute this to a hole-doped domain close to one of the metal contacts combined with underlying striations in the local NP. © 2010 American Institute of Physics.

Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:11
Last Modified: 08 Dec 2014 02:36
DOI: 10.1063/1.3327829