O'Neill, W and Gill, M and Perrie, W and Fox, P and Prior, D (2005) Analysis of femtosecond (775nm) and nanosecond (355nm) micromachined Ni surfaces using electron backscattering. In: Photon Processing in Microelectronics and Photonics IV, 5713. Society of Photo-Optical Instrumentation Engineers (SPIE), pp. 123-131.
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|Item Type: ||Book Section|
|Additional Information: ||Analysis of femtosecond (775nm) and nanosecond (355nm) micromachined Ni surfaces using electron backscattering cued:11166 Proceedings Series ISSN: 0277-786X. 4th conference on Photon Processing in Microelectronics and Photonics held in San Jose, CA, January 2005|
|Divisions: ||Div E > Production Processes|
|Depositing User: ||Cron Job|
|Date Deposited: ||25 Oct 2012 16:10|
|Last Modified: ||20 May 2013 01:37|
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