O'Neill, W and Gill, M and Perrie, W and Fox, P and Prior, D (2005) Analysis of femtosecond (775nm) and nanosecond (355nm) micromachined Ni surfaces using electron backscattering. In: Photon Processing in Microelectronics and Photonics IV, 5713. Society of Photo-Optical Instrumentation Engineers (SPIE), pp. 123-131.
Full text not available from this repository.
| Item Type: | Book Section |
|---|
| Additional Information: | Analysis of femtosecond (775nm) and nanosecond (355nm) micromachined Ni surfaces using electron backscattering cued:11166 Proceedings Series ISSN: 0277-786X. 4th conference on Photon Processing in Microelectronics and Photonics held in San Jose, CA, January 2005 |
|---|
| Subjects: | UNSPECIFIED |
|---|
| Divisions: | Div E > Production Processes |
|---|
| Depositing User: | Cron Job |
|---|
| Date Deposited: | 25 Oct 2012 16:10 |
|---|
| Last Modified: | 20 May 2013 01:37 |
|---|
| DOI: | |
|---|
Actions (login required)
