CUED Publications database

Surface characterisation of strontium-bismuth tantalate (SBT) thin films

Hartmann, AJ and Lamb, RN and Scott, JF and Johnston, PN and El Bouanani, M and Chen, CW and Robertson, J (1999) Surface characterisation of strontium-bismuth tantalate (SBT) thin films. Integrated Ferroelectrics, 23. pp. 113-126. ISSN 1058-4587

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A review of electronic structural data is given and an interface Schottky model has been developed. X-ray photoemission spectroscopy (XPS) and secondary electron emission data have been used to determine the electron affinity of SBT and the band match-up for the SBT/Pt junction. The results of X-ray absorption spectroscopy studies and XPS valence band measurements indicated the electronic states above and below the bandgap of SBT. These experimental data have been compared with the results of tight-binding calculations. Angle dependent XPS measurements indicated that metallic bismuth is diffusing to the surface of SBT which would have significant influence on the electrical properties of the SBT/Pt junction. The hydrogen distribution in SBT, also an important issue for the device properties, has been probed using elastic recoil detection.

Item Type: Article
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 19:53
Last Modified: 07 Mar 2019 15:45
DOI: 10.1080/10584589908210144