Morris, RJH and Dowsett, MG and Dalai, SH and Baptista, DL and Teo, KBK and Milne, WI (2007) Spatial determination of gold catalyst residue used in the production of ZnO nanowires by SIMS depth profiling analysis. Surface and Interface Analysis, 39. pp. 898-901. ISSN 0142-2421Full text not available from this repository.
In this paper we demonstrate how secondary ion mass spectrometry (SIMS) can be applied to ZnO nanowire structures for gold catalyst residue determination. Gold plays a significant role in determining the structural properties of such nanowires, with the location of the gold after growth being a strong indicator of the growth mechanism. For the material investigated here, we find that the gold remains at the substrate-nanowire interface. This was not anticipated as the usual growth mechanism associated with catalyst growth is of a vapour-liquid-solid (VLS) type. The results presented here favour a vapour-solid (VS) growth mechanism instead. Copyright © 2007 John Wiley & Sons, Ltd.
|Uncontrolled Keywords:||Nanowire growth SIMS depth profiling ZnO|
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Cron Job|
|Date Deposited:||07 Mar 2014 11:40|
|Last Modified:||08 Dec 2014 02:31|