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Analysis of the ellipsometric spectra of amorphous carbon thin films for evaluation of the sp<sup>3</sup>-bonded carbon content

Lee, J and Collins, RW and Veerasamy, VS and Robertson, J (1998) Analysis of the ellipsometric spectra of amorphous carbon thin films for evaluation of the sp<sup>3</sup>-bonded carbon content. Diamond and Related Materials, 7. pp. 999-1009. ISSN 0925-9635

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 19:22
Last Modified: 18 Jul 2017 10:49
DOI: