Lee, J and Collins, RW and Veerasamy, VS and Robertson, J (1998) Analysis of amorphous carbon thin films by spectroscopic ellipsometry. Journal of Non-Crystalline Solids, 227-23. pp. 617-621. ISSN 0022-3093
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | UNSPECIFIED |
| Depositing User: | Cron Job |
| Date Deposited: | 19 Jan 2012 10:12 |
| Last Modified: | 20 May 2013 01:34 |
| DOI: |
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