CUED Publications database

Analysis of amorphous carbon thin films by spectroscopic ellipsometry

Lee, J and Collins, RW and Veerasamy, VS and Robertson, J (1998) Analysis of amorphous carbon thin films by spectroscopic ellipsometry. Journal of Non-Crystalline Solids, 227-23. pp. 617-621. ISSN 0022-3093

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:44
Last Modified: 17 Mar 2014 15:01
DOI:

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