Ghaffarzadeh, K and Nathan, A and Robertson, J and Kim, S and Jeon, S and Kim, C and Chung, U-I and Lee, J-H (2010) Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress. Applied Physics Letters, 97. ISSN 0003-6951
Full text not available from this repository.
|Item Type: ||Article|
|Depositing User: ||Cron Job|
|Date Deposited: ||20 Jan 2012 12:11|
|Last Modified: ||20 May 2013 01:35|
Actions (login required)