Ghaffarzadeh, K and Nathan, A and Robertson, J and Kim, S and Jeon, S and Kim, C and Chung, U-I and Lee, J-H (2010) Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress. Applied Physics Letters, 97. ISSN 0003-6951Full text not available from this repository.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Cron Job|
|Date Deposited:||07 Mar 2014 12:03|
|Last Modified:||05 May 2014 01:10|
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