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HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SI-IMPLANTED AND ELECTRON-BEAM ANNEALED SILICON-ON-SAPPHIRE

SMITH, DJ and FREEMAN, LA and MCMAHON, RA and AHMED, H and PITT, MG and PETERS, TB (1983) HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SI-IMPLANTED AND ELECTRON-BEAM ANNEALED SILICON-ON-SAPPHIRE. INST PHYS CONF SER. pp. 83-88. ISSN 0951-3248

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Item Type: Article
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Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:26
Last Modified: 05 Feb 2015 00:36
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