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HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SI-IMPLANTED AND ELECTRON-BEAM ANNEALED SILICON-ON-SAPPHIRE

SMITH, DJ and FREEMAN, LA and MCMAHON, RA and AHMED, H and PITT, MG and PETERS, TB (1983) HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SI-IMPLANTED AND ELECTRON-BEAM ANNEALED SILICON-ON-SAPPHIRE. INST PHYS CONF SER. pp. 83-88. ISSN 0951-3248

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:05
Last Modified: 24 Aug 2016 03:47
DOI: