CUED Publications database

HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SI-IMPLANTED AND ELECTRON-BEAM ANNEALED SILICON-ON-SAPPHIRE

SMITH, DJ and FREEMAN, LA and MCMAHON, RA and AHMED, H and PITT, MG and PETERS, TB (1983) HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SI-IMPLANTED AND ELECTRON-BEAM ANNEALED SILICON-ON-SAPPHIRE. INST PHYS CONF SER. pp. 83-88. ISSN 0951-3248

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:53
Last Modified: 31 Aug 2015 08:09
DOI: