SMITH, DJ and FREEMAN, LA and MCMAHON, RA and AHMED, H and PITT, MG and PETERS, TB (1983) HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SI-IMPLANTED AND ELECTRON-BEAM ANNEALED SILICON-ON-SAPPHIRE. INST PHYS CONF SER. pp. 83-88. ISSN 0951-3248
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Electronics, Power & Energy Conversion |
| Depositing User: | Cron Job |
| Date Deposited: | 11 Nov 2011 10:24 |
| Last Modified: | 11 Mar 2013 02:02 |
| DOI: |
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