CUED Publications database

CHARACTERIZATION OF SI-IMPLANTED AND ELECTRON-BEAM-ANNEALED SILICON-ON-SAPPHIRE USING HIGH-RESOLUTION ELECTRON-MICROSCOPY

SMITH, DJ and FREEMAN, LA and MCMAHON, RA and AHMED, H and PITT, MG and PETERS, TB (1984) CHARACTERIZATION OF SI-IMPLANTED AND ELECTRON-BEAM-ANNEALED SILICON-ON-SAPPHIRE USING HIGH-RESOLUTION ELECTRON-MICROSCOPY. J APPL PHYS, 56. pp. 2207-2212. ISSN 0021-8979

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:05
Last Modified: 29 Aug 2016 11:12
DOI: