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Atomic force microscope nanolithography of graphene: Cuts, pseudocuts, and tip current measurements

Puddy, RK and Scard, PH and Tyndall, D and Connolly, MR and Smith, CG and Jones, GAC and Lombardo, A and Ferrari, AC and Buitelaar, MR (2011) Atomic force microscope nanolithography of graphene: Cuts, pseudocuts, and tip current measurements. APPL PHYS LETT, 98. -. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: SINGLE-ELECTRON TRANSISTOR QUANTUM DOTS LITHOGRAPHY FABRICATION
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron Job
Date Deposited: 01 Jan 2012 19:01
Last Modified: 27 May 2013 01:23
DOI: 10.1063/1.3573802

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