Taylor, S and Rosten, E and Drummond, TW (2009) Robust feature matching in 2.3 microseconds. In: IEEE Workshop on Feature Detectors and Descriptors, in Conjunction with CVPR 2009, IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshop, CVRP 2009, 21-6-2009 to --, Miami, USA pp. 15-22..
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = workshop Related urls = http://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumber=5204314&queryText%3D10.1109%2FCVPRW.2009.5204314%26openedRefinements%3D*%26searchField%3DSearch+All |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div F > Machine Intelligence |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 17:06 |
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| Last Modified: | 02 Jan 2012 01:23 |
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| DOI: | 10.1109/CVPRW.2009.5204314 |
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