CUED Publications database

Robust feature matching in 2.3 microseconds

Taylor, S and Rosten, E and Drummond, TW (2009) Robust feature matching in 2.3 microseconds. In: IEEE Workshop on Feature Detectors and Descriptors, in Conjunction with CVPR 2009, IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshop, CVRP 2009, 2009-6-21 to --, Miami, USA pp. 15-22..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Divisions: Div F > Machine Intelligence
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 20:41
Last Modified: 27 Jul 2017 06:40