CUED Publications database

Robust feature matching in 2.3 microseconds

Taylor, S and Rosten, E and Drummond, TW (2009) Robust feature matching in 2.3 microseconds. In: IEEE Workshop on Feature Detectors and Descriptors, in Conjunction with CVPR 2009, IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshop, CVRP 2009, 2009-6-21 to --, Miami, USA pp. 15-22..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div F > Machine Intelligence
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:42
Last Modified: 10 Mar 2014 18:06
DOI: 10.1109/CVPRW.2009.5204314