Lee, JEY and Seshia, AA (2008) Enhanced electrical characterization of MEMS resonators using on-chip parasitic feedthrough self-cancellation. In: 22nd International Conference EUROSENSORS, 7-9-2008 to 10-9-2008, Dresden, Germany.
Full text not available from this repository.
|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = conference Related urls = http://www.eurosensors2008.com/index.php?id=1700&no_cache=1|
|Divisions: ||Div C > Materials Engineering|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 17:05|
|Last Modified: ||18 Jun 2012 01:13|
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