CUED Publications database

Enhanced electrical characterization of MEMS resonators using on-chip parasitic feedthrough self-cancellation

Lee, JE-Y and Seshia, AA (2008) Enhanced electrical characterization of MEMS resonators using on-chip parasitic feedthrough self-cancellation. In: 22nd International Conference EUROSENSORS, 2008-9-7 to 2008-9-10, Dresden, Germany.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div C > Applied Mechanics
Depositing User: Cron Job
Date Deposited: 02 Sep 2016 16:32
Last Modified: 28 Sep 2016 05:55
DOI: