CUED Publications database

Enhanced electrical characterization of MEMS resonators using on-chip parasitic feedthrough self-cancellation

Lee, JEY and Seshia, AA (2008) Enhanced electrical characterization of MEMS resonators using on-chip parasitic feedthrough self-cancellation. In: 22nd International Conference EUROSENSORS, 2008-9-7 to 2008-9-10, Dresden, Germany.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div C > Applied Mechanics
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 14:41
Last Modified: 26 Jul 2015 00:06
DOI: