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Exploration of power device reliability using compact device models and fast electro-thermal simulation

Bryant, AT and Mawby, PA and Palmer, PR and Santi, E and Hudgins, JL (2006) Exploration of power device reliability using compact device models and fast electro-thermal simulation. In: 2006 IEEE Industry Applications Conference, 2006-10-8 to 2006-10-12, Tampa, FL, USA pp. 1465-1472..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:13
Last Modified: 02 Jun 2014 01:14
DOI: 10.1109/IAS.2006.256723

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