CUED Publications database

Exploration of power device reliability using compact device models and fast electro-thermal simulation

Bryant, AT and Mawby, PA and Palmer, PR and Santi, E and Hudgins, JL (2006) Exploration of power device reliability using compact device models and fast electro-thermal simulation. In: 2006 IEEE Industry Applications Conference, 2006-10-8 to 2006-10-12, Tampa, FL, USA pp. 1465-1472..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 13:36
Last Modified: 28 Apr 2016 06:58
DOI: 10.1109/IAS.2006.256723