CUED Publications database

Defect energy levels in high K gate oxides

Robertson, J and Xiong, K and Clark, SJ (2006) Defect energy levels in high K gate oxides. In: NATO Advanced Research Workshop on Defects in High-κ Dielectric Nano-electronic Semiconductor Devices, 2005-7- to --, Saint Petersburg, Russia pp. 175-188..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 20:06
Last Modified: 08 Mar 2018 01:51