CUED Publications database

Defect energy levels in high K gate oxides

Robertson, J and Xiong, K and Clark, SJ (2006) Defect energy levels in high K gate oxides. In: NATO Advanced Research Workshop on Defects in High-κ Dielectric Nano-electronic Semiconductor Devices, 2005-7- to --, Saint Petersburg, Russia pp. 175-188..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:52
Last Modified: 30 Nov 2015 15:58
DOI: 10.1007/1-4020-4367-8