CUED Publications database

Defect energy levels in high K gate oxides

Robertson, J and Xiong, K and Clark, SJ (2006) Defect energy levels in high K gate oxides. In: NATO Advanced Research Workshop on Defects in High-κ Dielectric Nano-electronic Semiconductor Devices, 2005-7- to --, Saint Petersburg, Russia pp. 175-188..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:52
Last Modified: 07 Oct 2015 02:58
DOI: 10.1007/1-4020-4367-8