Robertson, J and Xiong, K and Clark, SJ (2006) Defect energy levels in high K gate oxides. In: NATO Advanced Research Workshop on Defects in High-κ Dielectric Nano-electronic Semiconductor Devices, -7-2005 to --, Saint Petersburg, Russia pp. 175-188..
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = workshop |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 17:02 |
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| Last Modified: | 11 Mar 2013 02:00 |
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| DOI: | 10.1007/1-4020-4367-8 |
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