CUED Publications database

Nondestructive dynamic process monitoring using electrical capacitance tomography

Umer Zeeshan, I and Jeong Hoon, K and Min Chan, K and Sin, K and Jae Woo, P and Kyung Youn, K (2005) Nondestructive dynamic process monitoring using electrical capacitance tomography. In: 1st International Conference on Advanced Nondestructive Evaluation, 2005-11-7 to 2005-11-9, Jeju Island, Korea pp. 1671-1674..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: Nondestructive monitoring, electrical capacitance tomography, extended Kalman filtering, online reconstruction
Subjects: UNSPECIFIED
Divisions: Div F > Machine Intelligence
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 13:01
Last Modified: 10 Mar 2014 16:42
DOI: 10.4028/0-87849-412-x.1671