Umer Zeeshan, I and Jeong Hoon, K and Min Chan, K and Sin, K and Jae Woo, P and Kyung Youn, K (2005) Nondestructive dynamic process monitoring using electrical capacitance tomography. In: 1st International Conference on Advanced Nondestructive Evaluation, 7-11-2005 to 9-11-2005, Jeju Island, Korea pp. 1671-1674..
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference Related urls = http://www.scientific.net Funders = Grant from the Hyocheon Academic Research Fund of the Cheju National University Development Foundation. Contact email address = uzi20@eng.cam.ac.uk Published in Key Engineering Materials vol.231-233, part 2 pages 1671-1674; Journal contains: Proceedings of the 1st International Conference on Advanced Nondestructive Evaluation, Jeju Island, Korea, 7-9 November 2005; in 2 parts, entitled: Advanced Nondestructive Evaluation, edited by Seung-Seok Lee, Joon Hyun Lee, Ik Keun Park, Sung-Jin Song, Man Yong Choi; paper version ISBN: 978-0-87849-412-5, CD version ISBN: 978-0-87849-412-5; publication doi:10.4028/0-87849-412-x. |
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| Uncontrolled Keywords: | Nondestructive monitoring, electrical capacitance tomography, extended Kalman filtering, online reconstruction |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div F > Machine Intelligence |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 17:02 |
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| Last Modified: | 15 Nov 2011 10:25 |
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| DOI: | 10.4028/0-87849-412-x.1671 |
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