CUED Publications database

A test structure for Young's modulus extraction through capacitance-voltage measurements

Yan, J and Seshia, AA and Steeneken, PG and van Beek, JTM (2006) A test structure for Young's modulus extraction through capacitance-voltage measurements. In: CAMTEC Workshop, 2006-4-11 to --, Cambridge, UK.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div C > Applied Mechanics
Div D > Geotechnical and Environmental
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:20
Last Modified: 10 Mar 2014 18:06
DOI:

Actions (login required)

View Item