Yan, J and Seshia, AA and Steeneken, PG and van Beek, JTM (2006) A test structure for Young's modulus extraction through capacitance-voltage measurements. In: CAMTEC Workshop, 11-4-2006 to --, Cambridge, UK.
Full text not available from this repository.| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Event type = workshop Related urls = http://www.msm.cam.ac.uk/camtec/posters.html A workshop to celebrate the opening of the new CAMTEC [Cambridge Micro-Mechanical Testing Centre] facility at the Department of Materials Science and Metallurgy, University of Cambridge. |
| Subjects: | UNSPECIFIED |
| Divisions: | Div C > Materials Engineering Div D > Geotechnical and Environmental |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 17:02 |
| Last Modified: | 18 Mar 2013 01:07 |
| DOI: |
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