CUED Publications database

A test structure for Young's modulus extraction through capacitance-voltage measurements

Yan, J and Seshia, AA and Steeneken, PG and van Beek, JTM (2006) A test structure for Young's modulus extraction through capacitance-voltage measurements. In: CAMTEC Workshop, 2006-4-11 to --, Cambridge, UK.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div C > Applied Mechanics
Div D > Geotechnical and Environmental
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:24
Last Modified: 27 Jun 2016 07:36
DOI: