CUED Publications database

Simulating imaging with the scanning ion-conductance microscope

Adenle, OA and Fitzgerald, WJ (2005) Simulating imaging with the scanning ion-conductance microscope. In: 27th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2005-9-1 to 2005-9-4, Shanghai, China pp. 3410-3413..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div F > Signal Processing and Communications
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:49
Last Modified: 08 Dec 2014 02:39
DOI: 10.1109/IEMBS.2005.1617210