CUED Publications database

Simulating imaging with the scanning ion-conductance microscope

Adenle, OA and Fitzgerald, WJ (2005) Simulating imaging with the scanning ion-conductance microscope. In: 27th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 1-9-2005 to 4-9-2005, Shanghai, China pp. 3410-3413..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Event type = conference
Subjects: UNSPECIFIED
Divisions: Div F > Signal Processing and Communications
Depositing User: Cron Job
Date Deposited: 28 Oct 2011 17:02
Last Modified: 11 Mar 2013 01:49
DOI: 10.1109/IEMBS.2005.1617210

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