Robertson, J and Peacock, PW (2005) Atomic structure, interfaces and defects of high dielectric constant gate oxides. In: Materials Fundamentals of Gate Dielectrics. Springer, Netherlands, pp. 179-214. ISBN 9781402030772
Full text not available from this repository.| Item Type: | Book Section |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Electronics, Power & Energy Conversion |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 17:01 |
| Last Modified: | 23 Jan 2012 01:46 |
| DOI: | 10.1007/1-4020-3078-9_5 |
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