CUED Publications database

Atomic structure, interfaces and defects of high dielectric constant gate oxides

Robertson, J and Peacock, PW (2005) Atomic structure, interfaces and defects of high dielectric constant gate oxides. In: Materials Fundamentals of Gate Dielectrics. Springer, Netherlands, pp. 179-214.

Full text not available from this repository.
Item Type: Book Section
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 14:06
Last Modified: 28 Apr 2016 07:45
DOI: 10.1007/1-4020-3078-9_5