CUED Publications database

Atomic structure, interfaces and defects of high dielectric constant gate oxides

Robertson, J and Peacock, PW (2005) Atomic structure, interfaces and defects of high dielectric constant gate oxides. In: Materials Fundamentals of Gate Dielectrics. Springer, Netherlands, pp. 179-214.

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Item Type: Book Section
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:46
Last Modified: 05 Aug 2015 01:30
DOI: 10.1007/1-4020-3078-9_5