CUED Publications database

Atomic structure, interfaces and defects of high dielectric constant gate oxides

Robertson, J and Peacock, PW (2005) Atomic structure, interfaces and defects of high dielectric constant gate oxides. In: Materials Fundamentals of Gate Dielectrics. Springer, Netherlands, pp. 179-214.

Full text not available from this repository.
Item Type: Book Section
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 14:46
Last Modified: 01 Sep 2015 22:09
DOI: 10.1007/1-4020-3078-9_5