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Analysis of femtosecond (775nm) and nanosecond (355nm) micromachined Ni surfaces using electron backscattering

O'Neill, W and Gill, M and Perrie, W and Fox, P and Prior, D (2005) Analysis of femtosecond (775nm) and nanosecond (355nm) micromachined Ni surfaces using electron backscattering. In: Photon Processing in Microelectronics and Photonics IV, 5713. Society of Photo-Optical Instrumentation Engineers (SPIE), pp. 123-131.

Full text not available from this repository.
Item Type: Book Section
Subjects: UNSPECIFIED
Divisions: Div E > Production Processes
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:25
Last Modified: 10 Mar 2014 17:49
DOI: 10.1117/12.598484

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