O'Neill, W and Gill, M and Perrie, W and Fox, P and Prior, D (2005) Analysis of femtosecond (775nm) and nanosecond (355nm) micromachined Ni surfaces using electron backscattering. In: Photon Processing in Microelectronics and Photonics IV, 5713. Society of Photo-Optical Instrumentation Engineers (SPIE), pp. 123-131. ISBN 081945687X
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| Item Type: | Book Section |
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| Additional Information: | Proceedings Series ISSN: 0277-786X. 4th conference on Photon Processing in Microelectronics and Photonics held in San Jose, CA, January 2005 |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div E > Production Processes |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 17:01 |
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| Last Modified: | 29 Oct 2012 01:03 |
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| DOI: | 10.1117/12.598484 |
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