CUED Publications database

A test structure for Young modulus extraction through capacitance-voltage measurements

Yan, J and Seshia, AA and Steeneken, PG and van Beek, JTM (2005) A test structure for Young modulus extraction through capacitance-voltage measurements. In: 4th IEEE Conference on Sensors (IEEE Sensors 2005), 2005-10-31 to 2005-11-3, Irvine, CA, USA -..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div C > Applied Mechanics
Div D > Geotechnical and Environmental
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 20:10
Last Modified: 18 Aug 2020 10:14
DOI: 10.1109/ICSENS.2005.1597845