Yan, J and Seshia, AA and Steeneken, PG and van Beek, JTM (2005) A test structure for Young modulus extraction through capacitance-voltage measurements. In: 4th IEEE Conference on Sensors (IEEE Sensors 2005), 31-10-2005 to 3-11-2005, Irvine, CA, USA -..
Full text not available from this repository.| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Event type = conference Related urls = http://www.ewh.ieee.org/tc/sensors/sensors2005/ |
| Subjects: | UNSPECIFIED |
| Divisions: | Div C > Materials Engineering Div D > Geotechnical and Environmental |
| Depositing User: | Cron Job |
| Date Deposited: | 28 Oct 2011 17:00 |
| Last Modified: | 18 Mar 2013 01:07 |
| DOI: | 10.1109/ICSENS.2005.1597845 |
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