Mo, Y and Yan, F and Migliorato, P and Ishihara, R (2004) Simulation of twin boundary effect on TFT characteristics. In: The 7th International Symposium on Thin film Transistor Technologies, -10-2004 to -- pp. 130-135..
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|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = other Conference held in Honolulu, HI, October 2004. Edited by Kuo, Y. Conference item published as a book section.|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 17:00|
|Last Modified: ||15 Nov 2011 10:24|
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