Chu, DP and Zhang, ZG and Migliorato, P and Natori, E and Shimoda, T (2004) Quantification of imprint effect in a ferroelectric thin film capacitor. In: 16th International Symposium on Integrated Ferroelectrics (ISIF 2004), 2004-4- to --, Gyeongju, Korea.
Full text not available from this repository.| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Photonics Div B > Solid State Electronics and Nanoscale Science |
| Depositing User: | Cron Job |
| Date Deposited: | 17 Jul 2017 19:58 |
| Last Modified: | 27 Jul 2017 06:32 |
| DOI: |
