Chu, DP and Zhang, ZG and Migliorato, P and Natori, E and Shimoda, T (2004) Quantification of imprint effect in a ferroelectric thin film capacitor. In: 16th International Symposium on Integrated Ferroelectrics (ISIF 2004), -4-2004 to --, Gyeongju, Korea.
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Photonics |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 17:00 |
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| Last Modified: | 30 Jan 2012 01:07 |
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| DOI: | |
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