CUED Publications database

The use of condition maps in the design and testing of power electronic circuits and devices

Bryant, AT and Parker Allotey, NA and Palmer, PR (2004) The use of condition maps in the design and testing of power electronic circuits and devices. In: 2004 IEEE Industry Applications Conference. 39th IAS Annual Meeting, 2004-10-3 to 2004-10-7, Seattle, WA, USA pp. 2520-2527..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:52
Last Modified: 30 Nov 2014 21:46
DOI: 10.1109/IAS.2004.1348829