CUED Publications database

The use of condition maps in the design and testing of power electronic circuits and devices

Bryant, AT and Parker Allotey, NA and Palmer, PR (2004) The use of condition maps in the design and testing of power electronic circuits and devices. In: 2004 IEEE Industry Applications Conference. 39th IAS Annual Meeting, 2004-10-3 to 2004-10-7, Seattle, WA, USA pp. 2520-2527..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 18:27
Last Modified: 30 Jul 2016 23:31
DOI: 10.1109/IAS.2004.1348829