CUED Publications database

The use of condition maps in the design and testing of power electronic circuits and devices

Bryant, AT and Parker Allotey, N-A and Palmer, PR (2004) The use of condition maps in the design and testing of power electronic circuits and devices. In: 2004 IEEE Industry Applications Conference. 39th IAS Annual Meeting, 2004-10-3 to 2004-10-7, Seattle, WA, USA pp. 2520-2527..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 02 Sep 2016 17:28
Last Modified: 08 Dec 2016 09:41
DOI: