CUED Publications database

The use of condition maps in the design and testing of power electronic circuits and devices

Bryant, AT and Parker Allotey, NA and Palmer, PR (2004) The use of condition maps in the design and testing of power electronic circuits and devices. In: 2004 IEEE Industry Applications Conference. 39th IAS Annual Meeting, 2004-10-3 to 2004-10-7, Seattle, WA, USA pp. 2520-2527..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:21
Last Modified: 01 May 2015 19:20
DOI: 10.1109/IAS.2004.1348829