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Measurement of low frequency hysteresis of SBT ferroelectric thin films using Sawyer-Tower circuit

Chu, DP and Zhang, ZG and McGregor, BM and Migliorato, P and Sawasaki, T and Hasegawa, K and Natori, E and Shimoda, T (2003) Measurement of low frequency hysteresis of SBT ferroelectric thin films using Sawyer-Tower circuit. In: 15th International Symposium on Integrated Ferroelectrics (ISIF 2003), 2003-3- to --, Colorado Springs, Colorado, USA.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Photonics
Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:37
Last Modified: 17 Mar 2014 14:42
DOI:

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