CUED Publications database

AC measurement for characterizing the trap processes in poly-silicon TFTs

Yan, F and Migliorato, P and Shimoda, T (2003) AC measurement for characterizing the trap processes in poly-silicon TFTs. In: The SPIE International Conference on Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas, 2003-1- to -- pp. 165-169..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:48
Last Modified: 27 Nov 2014 19:22
DOI: