Yan, F and Migliorato, P and Shimoda, T (2003) AC measurement for characterizing the trap processes in poly-silicon TFTs. In: The SPIE International Conference on Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas, -1-2003 to -- pp. 165-169..
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|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = conference Conference held in Santa Clara, CA, January 2003. Edited by Voutsas, A. T. Series ISSN: 0277-786X. Conference item published as a book section.|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:58|
|Last Modified: ||20 May 2013 01:34|
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