CUED Publications database

AC measurement for characterizing the trap processes in poly-silicon TFTs

Yan, F and Migliorato, P and Shimoda, T (2003) AC measurement for characterizing the trap processes in poly-silicon TFTs. In: The SPIE International Conference on Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas, 2003-1- to -- pp. 165-169..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
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Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:09
Last Modified: 05 Feb 2015 00:13
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