Yan, F and Migliorato, P and Shimoda, T (2003) AC measurement for characterizing the trap processes in poly-silicon TFTs. In: The SPIE International Conference on Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas, -1-2003 to -- pp. 165-169..
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference Conference held in Santa Clara, CA, January 2003. Edited by Voutsas, A. T. Series ISSN: 0277-786X. Conference item published as a book section. |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:58 |
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| Last Modified: | 20 May 2013 01:34 |
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| DOI: | |
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