Chu, DP and Zhang, ZG and McGregor, BM and Migliorato, P and Ohashi, K and Hasegawa, K and Shimoda, T (2002) Characterization of imprint in Ferroelectric thin films. In: International Conference on Electronic Materials (ICEM 2002), 2002-6- to --, Xi’an, China.
Full text not available from this repository.| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Photonics Div B > Solid State Electronics and Nanoscale Science |
| Depositing User: | Cron Job |
| Date Deposited: | 17 Jul 2017 19:58 |
| Last Modified: | 27 Jul 2017 06:29 |
| DOI: |
