Chu, DP and Zhang, ZG and McGregor, BM and Migliorato, P and Ohashi, K and Hasegawa, K and Shimoda, T (2002) Characterization of imprint in Ferroelectric thin films. In: International Conference on Electronic Materials (ICEM 2002), -6-2002 to --, Xi’an, China.
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Photonics |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:58 |
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| Last Modified: | 30 Jan 2012 01:07 |
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| DOI: | |
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