CUED Publications database

Temperature effects on trench-gate IGBTs

Santi, E and Caiafa, A and Kang, X and Hudgins, JL and Palmer, PR and Goodwine, D and Monti, A (2001) Temperature effects on trench-gate IGBTs. In: IEEE Industry Applications Conference, 2001, 2001-9-30 to 2001-10-4, Chicago, IL, USA pp. 1931-1937..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:11
Last Modified: 04 Oct 2015 04:29
DOI: 10.1109/IAS.2001.955794