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The kink effect: transient measurements of low temperature polysilicon thin film transistors

Bavidge, NG and Boero, M and Migliorato, P and Shimoda, T (2001) The kink effect: transient measurements of low temperature polysilicon thin film transistors. In: International Workshop on Active Matrix Liquid Crystal Displays (AM-LCD'01), 2001-7-11 to 2001-7-13, Tokyo, Japan p.163-..

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Date Deposited: 16 Jul 2015 14:59
Last Modified: 31 Aug 2015 06:28
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