Cakmak, B and Penty, RV and White, IH (2001) Scanning electron and atomic force microscopy measurements of ion beam etched InP samples using Ar/H2 chemistry. In: 4th Conference on Optical Manufacturing and Testing, -8-2001 to --, San Diego, CA, USA pp. 306-312..
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = other |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Photonics |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:56 |
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| Last Modified: | 16 May 2013 19:17 |
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| DOI: | |
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