CUED Publications database

Scanning electron and atomic force microscopy measurements of ion beam etched InP samples using Ar/H2 chemistry

Cakmak, B and Penty, RV and White, IH (2001) Scanning electron and atomic force microscopy measurements of ion beam etched InP samples using Ar/H2 chemistry. In: 4th Conference on Optical Manufacturing and Testing, 2001-8- to --, San Diego, CA, USA pp. 306-312..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Photonics
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:48
Last Modified: 10 Mar 2014 16:54
DOI: