Cakmak, B and Penty, RV and White, IH (2001) Scanning electron and atomic force microscopy measurements of ion beam etched InP samples using Ar/H2 chemistry. In: 4th Conference on Optical Manufacturing and Testing, -8-2001 to --, San Diego, CA, USA pp. 306-312..
Full text not available from this repository.
|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = other|
|Divisions: ||Div B > Photonics|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:56|
|Last Modified: ||20 May 2013 01:34|
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