CUED Publications database

Surface assessment of a chemically assisted ion beam etched InP sample using scanning electron microscopy and atomic force microscopy techniques

Cakmak, B and Penty, RV and White, IH (2001) Surface assessment of a chemically assisted ion beam etched InP sample using scanning electron microscopy and atomic force microscopy techniques. In: 4th Pacific Rim Conference on Lasers and Electro-Optics, CLEO' 01, 2001-7- to --, Chiba, Japan pp. 224-225..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Photonics
Depositing User: Cron job
Date Deposited: 04 Feb 2015 22:08
Last Modified: 01 May 2015 19:08
DOI: