Cakmak, B and Penty, RV and White, IH (2001) Surface assessment of a chemically assisted ion beam etched InP sample using scanning electron microscopy and atomic force microscopy techniques. In: 4th Pacific Rim Conference on Lasers and Electro-Optics, CLEO' 01, -7-2001 to --, Chiba, Japan pp. 224-225..
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|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = conference|
|Divisions: ||Div B > Photonics|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:56|
|Last Modified: ||01 Apr 2013 01:10|
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