Mihaila, A and Udrea, F and Amaratunga, GAJ and Brezeanu, G (2000) A comprehensive analysis of breakdown mechanisms in 4H-SiC MOSFET and JFET. In: The 23rd International Semiconductor Conference; CAS 2000, -10-2000 to --, Sinaia, Romania pp. 185-188..
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Electronics, Power & Energy Conversion |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:56 |
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| Last Modified: | 22 Apr 2013 01:05 |
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| DOI: | |
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