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A comprehensive analysis of breakdown mechanisms in 4H-SiC MOSFET and JFET

Mihaila, A and Udrea, F and Amaratunga, GAJ and Brezeanu, G (2000) A comprehensive analysis of breakdown mechanisms in 4H-SiC MOSFET and JFET. In: The 23rd International Semiconductor Conference; CAS 2000, 2000-10- to --, Sinaia, Romania pp. 185-188..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:55
Last Modified: 10 Mar 2014 16:09
DOI:

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