CUED Publications database

A comprehensive analysis of breakdown mechanisms in 4H-SiC MOSFET and JFET

Mihaila, A and Udrea, F and Amaratunga, GAJ and Brezeanu, G (2000) A comprehensive analysis of breakdown mechanisms in 4H-SiC MOSFET and JFET. In: The 23rd International Semiconductor Conference; CAS 2000, 2000-10- to --, Sinaia, Romania pp. 185-188..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
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Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:05
Last Modified: 29 Aug 2015 23:10
DOI: