CUED Publications database

Reverse doped structure for high breakdown voltages and low on-resistance in SOI power devices

Ng, R and Udrea, F (2000) Reverse doped structure for high breakdown voltages and low on-resistance in SOI power devices. In: The 5th International Symposium on Power Semiconductors, ISPS' 00, 2000-9- to --, Prague, Czech Republic pp. 157-161..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
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Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 14:49
Last Modified: 03 Sep 2015 21:38
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