O'Shea, SJ and Lantz, MA and Welland, ME (1998) Atomic force microscopy in liquid environments. In: 3rd Conference on Development and Industrial Application of Scanning Probe Methods (SXM-3), 14-9-1998 to 17-9-1998, Basel, Switzerland.
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|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = conference|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:54|
|Last Modified: ||15 Nov 2011 10:21|
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