CUED Publications database

Atomic force microscopy in liquid environments

O'Shea, SJ and Lantz, MA and Welland, ME (1998) Atomic force microscopy in liquid environments. In: 3rd Conference on Development and Industrial Application of Scanning Probe Methods (SXM-3), 1998-9-14 to 1998-9-17, Basel, Switzerland.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email
Date Deposited: 09 Dec 2016 18:07
Last Modified: 26 May 2017 22:12