CUED Publications database

Analysis and manipulation of electrically stressed nanowires using AFM

Hersam, MC and Hoole, ACF and O'Shea, SJ and Welland, ME (1997) Analysis and manipulation of electrically stressed nanowires using AFM. In: Scanning Tunneling Microscopy Conference, STM' 97, 1997-7-20 to 1997-7-25, Hamburg, Germany.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 18:43
Last Modified: 24 May 2016 22:17
DOI: