CUED Publications database

Analysis and manipulation of electrically stressed nanowires using AFM

Hersam, MC and Hoole, ACF and O'Shea, SJ and Welland, ME (1997) Analysis and manipulation of electrically stressed nanowires using AFM. In: Scanning Tunneling Microscopy Conference, STM' 97, 1997-7-20 to 1997-7-25, Hamburg, Germany.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 15 Dec 2015 14:16
Last Modified: 06 May 2016 04:41
DOI: