CUED Publications database

Analysis and manipulation of electrically stressed nanowires using AFM

Hersam, MC and Hoole, ACF and O'Shea, SJ and Welland, ME (1997) Analysis and manipulation of electrically stressed nanowires using AFM. In: Scanning Tunneling Microscopy Conference, STM' 97, 1997-7-20 to 1997-7-25, Hamburg, Germany.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:58
Last Modified: 05 Sep 2015 02:04
DOI: