Caldwell, NHM and Breton, BC and Holburn, DM (1997) XpertEze : a knowledge-based approach to scanning electron microscopy. In: Applications and innovations in expert systems V. Proceedings of the Expert Systems '97 Conference, 1997-12-15 to 1997-12-17, Churchill College, Cambridge, UK pp. 127-140..Full text not available from this repository.
|Item Type:||Conference or Workshop Item (UNSPECIFIED)|
|Divisions:||Div C > Engineering Design|
Div B > Solid State Electronics and Nanoscale Science
|Depositing User:||Unnamed user with email email@example.com|
|Date Deposited:||15 Dec 2015 13:55|
|Last Modified:||04 May 2016 03:25|