CUED Publications database

XpertEze : a knowledge-based approach to scanning electron microscopy

Caldwell, NHM and Breton, BC and Holburn, DM (1997) XpertEze : a knowledge-based approach to scanning electron microscopy. In: Applications and innovations in expert systems V. Proceedings of the Expert Systems '97 Conference, 1997-12-15 to 1997-12-17, Churchill College, Cambridge, UK pp. 127-140..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div C > Engineering Design
Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:12
Last Modified: 17 Mar 2014 14:59
DOI: