Caldwell, NHM and Breton, BC and Holburn, DM (1997) XpertEze : a knowledge-based approach to scanning electron microscopy. In: Applications and innovations in expert systems V. Proceedings of the Expert Systems '97 Conference, 15-12-1997 to 17-12-1997, Churchill College, Cambridge, UK pp. 127-140..
Full text not available from this repository.
|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = conference Conference held in Cambridge, 15-17 December 1997. Edited by Macintosh, A.; Milne, R. Conference item published as a book section. Unmapped Imported Data : Isbn = 1988621210|
|Divisions: ||Div C > Engineering Design|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:37|
|Last Modified: ||22 Jul 2013 01:02|
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