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Non-invasive measurement of chip currents in IGBT Modules

Palmer, PR and Stark, BH and Joyce, JC (1997) Non-invasive measurement of chip currents in IGBT Modules. In: 28th Annual IEEE Power Electronics Specialists Conference (PESC '97), 22-6-1997 to 27-6-1997, St Louis, MO, USA pp. 166-171..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Event type = conference IGBT: Insulated Gate Bipolar Transistor.
Subjects: UNSPECIFIED
Divisions: Div B > Electronics, Power & Energy Conversion
Depositing User: Cron Job
Date Deposited: 28 Oct 2011 16:37
Last Modified: 11 Mar 2013 01:59
DOI: 10.1109/PESC.1997.616722

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