Caldwell, NHM and Breton, BC and Holburn, DM (1996) An expert system for fault diagnosis in the scanning electron microscope. In: Applications and innovations in expert systems IV. Proceedings of the Expert Systems '96 Conference, 16-12-1996 to 18-12-1996, Cambridge, UK pp. 177-188..
Full text not available from this repository.
|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = conference Conference held in Cambridge, 16-18 September 1996. Conference item published as a book section.|
|Divisions: ||Div C > Engineering Design|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:37|
|Last Modified: ||22 Jul 2013 01:02|
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