Caldwell, NHM and Breton, BC and Holburn, DM (1996) An expert system for fault diagnosis in the scanning electron microscope. In: Applications and innovations in expert systems IV. Proceedings of the Expert Systems '96 Conference, 16-12-1996 to 18-12-1996, Cambridge, UK pp. 177-188..
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference Conference held in Cambridge, 16-18 September 1996. Conference item published as a book section. |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div C > Engineering Design |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:37 |
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| Last Modified: | 13 May 2013 01:02 |
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| DOI: | |
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