CUED Publications database

An expert system for fault diagnosis in the scanning electron microscope

Caldwell, NHM and Breton, BC and Holburn, DM (1996) An expert system for fault diagnosis in the scanning electron microscope. In: Applications and innovations in expert systems IV. Proceedings of the Expert Systems '96 Conference, 1996-12-16 to 1996-12-18, Cambridge, UK pp. 177-188..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div C > Engineering Design
Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 19:30
Last Modified: 28 Jul 2016 09:19
DOI: