CUED Publications database

An expert system for fault diagnosis in the scanning electron microscope

Caldwell, NHM and Breton, BC and Holburn, DM (1996) An expert system for fault diagnosis in the scanning electron microscope. In: Applications and innovations in expert systems IV. Proceedings of the Expert Systems '96 Conference, 1996-12-16 to 1996-12-18, Cambridge, UK pp. 177-188..

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div C > Engineering Design
Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 19:30
Last Modified: 24 May 2016 22:55
DOI: