Cham, TJ and Cipolla, R (1994) A local approach to recovering global skewed symmetry. In: The 12th IEEE International Conference on Pattern Recognition (IAPR'94), -10-1994 to --, Jerusalem, Israel pp. 222-226..
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div F > Machine Intelligence |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:52 |
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| Last Modified: | 11 Mar 2013 01:57 |
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| DOI: | |
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