Johnson, CM and Palmer, PR and Hinchley, DA (1994) Identification of the performance critical steps in power semiconductor processing. In: 5th European Symposium on Reliability of Electron Devices, 4-10-1994 to 7-10-1994, Glasgow, Scotland.
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|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = conference|
|Divisions: ||Div B > Electronics, Power & Energy Conversion|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:37|
|Last Modified: ||30 Jan 2012 01:08|
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