Johnson, CM and Palmer, PR and Hinchley, DA (1994) Identification of the performance critical steps in power semiconductor processing. In: 5th European Symposium on Reliability of Electron Devices, 4-10-1994 to 7-10-1994, Glasgow, Scotland.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference |
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| Subjects: | UNSPECIFIED |
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| Divisions: | Div B > Electronics, Power & Energy Conversion |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:37 |
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| Last Modified: | 30 Jan 2012 01:08 |
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| DOI: | |
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