Stephenson, R and Rayment, T and Welland, ME (1993) Development of a scanning optical probe microscope incorporating atomic force feedback control. In: 2nd International Conference on Near-Field Optics, 20-10-1993 to 22-10-1993, Raleigh, NC, USA.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:51 |
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| Last Modified: | 15 Nov 2011 10:20 |
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| DOI: | |
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