CUED Publications database

Development of a scanning optical probe microscope incorporating atomic force feedback control

Stephenson, R and Rayment, T and Welland, ME (1993) Development of a scanning optical probe microscope incorporating atomic force feedback control. In: 2nd International Conference on Near-Field Optics, 1993-10-20 to 1993-10-22, Raleigh, NC, USA.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 02 Sep 2016 17:15
Last Modified: 01 Dec 2016 08:34
DOI: