CUED Publications database

Development of a scanning optical probe microscope incorporating atomic force feedback control

Stephenson, R and Rayment, T and Welland, ME (1993) Development of a scanning optical probe microscope incorporating atomic force feedback control. In: 2nd International Conference on Near-Field Optics, 1993-10-20 to 1993-10-22, Raleigh, NC, USA.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:57
Last Modified: 31 Aug 2015 04:42
DOI: