Murrell, MP and Welland, ME and Wong, TMH (1993) Spatially resolved characterization of the Si/SiO2 system using conducting atomic force microscopy. In: The 25th International Conference on Solid State Devices and Materials (SSDM 1993), -8-1993 to -- pp. 92-94..
Full text not available from this repository.
|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = conference Conference held in Chiba; Japan, August 1993. Conference item published as a book section.|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:51|
|Last Modified: ||15 Nov 2011 10:20|
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