CUED Publications database

Technological applications of scanned probe microscopy

Welland, ME (1993) Technological applications of scanned probe microscopy. In: The 3rd European Conference on Advanced Materials and Processes, 1993-6-8 to 1993-6-10, Paris, France.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 02 Sep 2016 17:15
Last Modified: 07 Dec 2016 02:00
DOI: