CUED Publications database

Technological applications of scanned probe microscopy

Welland, ME (1993) Technological applications of scanned probe microscopy. In: The 3rd European Conference on Advanced Materials and Processes, 1993-6-8 to 1993-6-10, Paris, France.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 12:55
Last Modified: 17 Mar 2014 14:49
DOI:

Actions (login required)

View Item