Welland, ME (1993) Technological applications of scanned probe microscopy. In: The 3rd European Conference on Advanced Materials and Processes, 8-6-1993 to 10-6-1993, Paris, France.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference ISSN 1155-4339 |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:51 |
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| Last Modified: | 15 Nov 2011 10:20 |
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| DOI: | |
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