CUED Publications database

Technological applications of scanned probe microscopy

Welland, ME (1993) Technological applications of scanned probe microscopy. In: The 3rd European Conference on Advanced Materials and Processes, 1993-6-8 to 1993-6-10, Paris, France.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:57
Last Modified: 26 Jul 2015 03:01
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