CUED Publications database

Technological applications of scanned probe microscopy

Welland, ME (1993) Technological applications of scanned probe microscopy. In: The 3rd European Conference on Advanced Materials and Processes, 1993-6-8 to 1993-6-10, Paris, France.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 18:43
Last Modified: 27 May 2016 21:59
DOI: