Welland, ME (1993) Technological applications of scanned probe microscopy. In: The 3rd European Conference on Advanced Materials and Processes, 8-6-1993 to 10-6-1993, Paris, France.
Full text not available from this repository.
|Item Type: ||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information: ||Event type = conference ISSN 1155-4339|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:51|
|Last Modified: ||15 Nov 2011 10:20|
Actions (login required)