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An STM study of the oxidation of the silicon (100) surface

Golen, B and Welland, ME (1991) An STM study of the oxidation of the silicon (100) surface. In: International Conference on Scanning Tunneling Microscopy (STM'91), 1991-8-12 to 1991-8-16, Interlaken, Switzerland.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
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Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:57
Last Modified: 02 Aug 2015 01:39
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