Golen, B and Welland, ME (1991) An STM study of the oxidation of the silicon (100) surface. In: International Conference on Scanning Tunneling Microscopy (STM'91), 12-8-1991 to 16-8-1991, Interlaken, Switzerland.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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| Additional Information: | Event type = conference |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:51 |
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| Last Modified: | 15 Nov 2011 10:20 |
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| DOI: | |
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