Welland, ME (1990) An STM study of the oxygenation of Silicon. In: Scanning Microscopy. EURATOM Publications: ESPRIT Basic Research Series, 14433 . Springer-Verlag, Berlin, Germany, pp. 49-66.
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| Item Type: | Book Section |
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| Additional Information: | Proceedings of a symposium held in Wetzlar, Germany, October 1990. Edited by Kessing, R. |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 28 Oct 2011 16:51 |
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| Last Modified: | 15 Nov 2011 10:20 |
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| DOI: | |
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