Welland, ME (1990) An STM study of the oxygenation of Silicon. In: Scanning Microscopy. EURATOM Publications: ESPRIT Basic Research Series, 14433 . Springer-Verlag, Berlin, Germany, pp. 49-66.
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|Item Type: ||Book Section|
|Additional Information: ||Proceedings of a symposium held in Wetzlar, Germany, October 1990. Edited by Kessing, R.|
|Depositing User: ||Cron Job|
|Date Deposited: ||28 Oct 2011 16:51|
|Last Modified: ||15 Nov 2011 10:20|
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